Chang, J.-J., Hwang, S.-L. and Wen, C.-H. 2022. The Development of a Training Expert System for TFT-LCD Defects Inspection. International Journal of Industrial Engineering: Theory, Applications and Practice. 16, 1 (Mar. 2022), 41–50. DOI:https://doi.org/10.23055/ijietap.2009.16.1.203.