Zernig, A., Bluder, O., Pilz, J., Kästner, A. and Krauth, A. 2017. IDENTIFICATION OF RISK DEVICES USING INDEPENDENT COMPONENT ANALYSIS FOR SEMICONDUCTOR MEASUREMENT DATA. International Journal of Industrial Engineering: Theory, Applications and Practice. 23, 5 (Jan. 2017). DOI:https://doi.org/10.23055/ijietap.2016.23.5.2852.