Zernig, A., Bluder, O., Pilz, J., Kästner, A., & Krauth, A. (2017). IDENTIFICATION OF RISK DEVICES USING INDEPENDENT COMPONENT ANALYSIS FOR SEMICONDUCTOR MEASUREMENT DATA. International Journal of Industrial Engineering: Theory, Applications and Practice, 23(5). https://doi.org/10.23055/ijietap.2016.23.5.2852