CHANG, J.-J.; HWANG, S.-L.; WEN, C.-H. The Development of a Training Expert System for TFT-LCD Defects Inspection. International Journal of Industrial Engineering: Theory, Applications and Practice, [S. l.], v. 16, n. 1, p. 41–50, 2022. DOI: 10.23055/ijietap.2009.16.1.203. Disponível em: https://ijietap.journals.publicknowledgeproject.org/index.php/ijie/article/view/203. Acesso em: 25 nov. 2024.