CHANG, C.-W.; CHIANG, D. M.-H.; CHANG, Y.-C.; HU, N.-Z. Critical equipments decision support system for process layout environment: a case of wafer FAB. International Journal of Industrial Engineering: Theory, Applications and Practice, [S. l.], v. 17, n. 3, 2010. DOI: 10.23055/ijietap.2010.17.3.320. Disponível em: https://ijietap.journals.publicknowledgeproject.org/index.php/ijie/article/view/320. Acesso em: 25 nov. 2024.