PARK, C.; PARK, S. H.; KIM, S. B. STRUCTURED REGULARIZATION MODELING FOR VIRTUAL METROLOGY IN SEMICONDUCTOR MANUFACTURING PROCESSES. International Journal of Industrial Engineering: Theory, Applications and Practice, [S. l.], v. 26, n. 6, 2020. DOI: 10.23055/ijietap.2019.26.6.4985. Disponível em: https://ijietap.journals.publicknowledgeproject.org/index.php/ijie/article/view/4985. Acesso em: 25 nov. 2024.