Mun, Byeong Min, Chinuk Lee, Suk Joo Bae, Seung-gyo Jang, and Byung Tae Ryu. 2019. “A Bayesian Approach for Predicting Functional Reliability of One-Shot Devices”. International Journal of Industrial Engineering: Theory, Applications and Practice 26 (1). https://doi.org/10.23055/ijietap.2019.26.1.3638.