Mun BM, Lee C, Bae SJ, Jang S- gyo, Ryu BT. A Bayesian Approach for Predicting Functional Reliability of One-Shot Devices. Int J Ind Eng [Internet]. 2019 Mar. 23 [cited 2024 Nov. 25];26(1). Available from: https://ijietap.journals.publicknowledgeproject.org/index.php/ijie/article/view/3638